newSource : phys.org
The IBM lab responsible for inventing the scanning tunneling microscope and the atomic force microscope has invented another critical tool for helping us understand the nanoworld.
Accurately measuring the temperature of objects at the nanoscale has been challenging scientists for decades. Current techniques are not accurate and they typically generate artifacts, limiting their reliability.
Motivated by this challenge and their need to precisely characterize the temperature of new transistor designs to meet the demand of future cognitive computers, scientists in Switzerland from IBM and ETH Zurich have invented a breakthrough technique to measure the temperature of nano- and macro-sized objects. The patent-pending invention is being disclosed for the first time today in the peer-review journal Nature Communications, “Temperature mapping of operating nanoscale devices by scanning probe thermometry.”
A History of Invention
In the 1980s, IBM scientists Gerd Binnig and the late Heinrich Rohrer wanted to directly explore a surface’s electronic structure and imperfections. The instrument they needed to take such measurements didn’t exist, yet. So they did what any good scientist would do: they invented one. It became known as the scanning tunneling microscope (STM), opening the door to nanotechnology. Just a few years later, the invention was recognized with the highest of honors, the Nobel Prize for Physics in 1986.